Abstract

The energy distributions of Me atoms and MeO molecules (Me=metal) sputtered by 2 keV Ar + ions have been determined by means of energy resolved secondary neutral mass spectrometry (SNMS). The oxygen surface concentration c O s of the polycrystalline samples was varied by oxygen exposure under simultaneous Ar + bombardment. In particular the normalized Me energy distributions became significantly broader with increasing c O s , while such an influence was less pronounced for MeO. Additionally, the c O s -dependence of the partial sputter yields Y Me and Y MeO was obtained by integrating the respective energy spectra. While Y Me is found to decrease monotonously with increasing c O s , Y MeO shows a maximum around c O s =0.5, which in the case of Ta has been reported earlier. This nonmonotonous behaviour as well as the observed c O s -dependence of the Me and MeO energy distributions is discussed in terms of an energy dependent version of the direct emission model proposed earlier for the formation of sputtered MeO.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call