Abstract
The benefits of using energy-dispersive X-ray fluorescence analysis (EDXRF) for geochemical mapping projects are described. Thick pellets of geochemical samples, soil and sediment were measured in a secondary target excitation EDXRF system, using Mn and Mo secondary targets for excitation of low- and medium-Z elements, respectively. Ba and some rare earth elements were determined using an Am-241 source. A fundamental parameter approach and the program COREX were used for calculating the concentrations. Depending on the composition of the sample, 20-30 elements could be determined. The precision and accuracy of the method were evaluated by repeated analyses of a series of standard reference materials recommended for use as primary standards in geochemical mapping. In most cases, the results showed good agreement with the certified values, i.e. the data were within recommended limits.
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