Abstract
A novel technique, energy dispersive near edge X-ray absorption fine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
