Abstract
Not every xenon ion of E < 50 keV produces a defect cluster visible by transmission electron microscopy. The recently reported larger yields in heavy ion bombardment of gold are probably due to the additional damage produced by neutral particles. At E > 50 keV a one-to-one correspondence between number of incident ions and defect bunches is observed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have