Abstract
The nonlinear errors caused by the gamma effect seriously affect the measurement accuracy of phase-measuring profilometry systems. We present a novel robust end-to-end pattern optimization technology for phase-height mapping. This method generates standard sinusoidal patterns on the reference plane on a camera image instead of on a projection image by optimizing the projection image, which can avoid phase errors due to phase conversion from projector to camera. The pixel set mapping is achieved by chessboard calibration; then the projection image is optimized with the multiscale optimization method and the dislocation optimization method based on proportional integral derivative control. The experiments show that the proposed method can effectively avoid the influence of nonlinear effect and achieve high-quality three-dimensional measurement.
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