EMSim: A Fast Layout Level Electromagnetic Emanation Simulation Framework for High Accuracy Pre-Silicon Verification

Abstract

Electromagnetic (EM) emanation measurement and evaluation is one important testing for modern integrated circuits (ICs). Severe electromagnetic interference may degrade the performance of electronic devices or even cause system crashes. As a result, modern ICs need to follow strict electromagnetic compatibility (EMC) requirements. Moreover, EM emanations offer a covert channel for adversaries to steal secret information from fabricated ICs, causing side channel attacks. Due to the lack of fast and high-accuracy EM simulation tools, existing EM measurements often happen at the post-silicon stage. Any identification of side channel vulnerability or EM incompatibility may lead to high cost and delay the time-to-market. As a result, design-time EM simulation tools with fast simulation speed and high accuracy for pre-silicon designs are urgently needed. To this end, we propose EMSIM, a layout-level EM simulation framework that significantly speeds up the EM simulation process while maintaining high accuracy of the simulated EM emanations. To achieve this goal, we provide the theoretical explanation for the root cause of EM emanations from ICs. Guiding by this, EMSIM leverages techniques of parasitic network reduction and device model approximation to reduce the computation complexities while still ensuring high simulation accuracy. EMSIM further leverages Graphics Processing Unit (GPU) resources to solve equations for EM simulation. The efficiency and effectiveness of EMSIM are validated by showing the consistency between simulation results and physical measurements obtained from fabricated circuit designs.