Abstract
AbstractAn empirical model for electromigration-induced early resistance changes is given. The basis olthe model are two coupled partial differential equations, one for vacancies, and one for mobile atoms. These equations are then solved numerically. For model verification purposes model calculations are compared with experimentally obtained resistance change curves.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
