Abstract
We report on a photoluminescence (PL) enhancement in IZO/Ag/IZO sandwiched structure via surface plasmonic effects of 14nm-thick Ag film. In the presence of Ag thin film, the 2–8-fold enhancement was observed for the broad PL around 2.34eV, which can be originated from defect states in amorphous IZO film. The results of time-resolved PL spectra suggested that the increase in radiative recombination rate, and the maximum Purcell factor of 19 was estimated from the analysis of the PL decay profiles. The comparison between the results of static- and dynamic-PL measurement suggests that the non-radiative process after the excitation of the surface plasmon of the silver film also affects the total efficiency of the emission enhancement.
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