Abstract
Measurements in commercial devices demonstrate a considerable susceptibility of the operational amplifiers to the electromagnetic interferences coupled to their output pin. This paper investigates some basic architectures starting from single stage amplifiers up to a whole operational amplifier. The result is a correlation between the different amplifier configurations, the output impedance and the susceptibility to the interferences. The simulations are perfomed by using the standard CMOS UMC 180nm technology and by running the netlist of the schematics extracted from the layout.
Highlights
The assessment of integrated circuit (IC) immunity to electromagnetic interference (EMI) is presently compulsory for many applications, because, thanks to the progress of VLSI, electronics is ubiquitous
The exact repercussion of electromagnetic interference (EMI), which is injected conductively into arbitrary pins of an integrated circuit (IC), is very hard to predict owing to the fact that all the existing coupling paths need to be taken into account [7]
The exact repercussion of electromagnetic interference, which is injected into arbitrary pins of an integrated amplifier, is very hard to predict owing to the fact that all the existing coupling paths need to be taken into account
Summary
The assessment of IC immunity to EMI is presently compulsory for many applications, because, thanks to the progress of VLSI, electronics is ubiquitous. The susceptibility of analog integrated circuits to conducted EMI has been modelled and verified with simulations as well as experimentally in several works, and analytical models predicting high-power. The susceptibility of the Operational Amplifiers to the Electromagnetic Interferences capacitively coupled to the ouput pin has been demonstrated in recent works [18,19,20], involving both commercial amplifiers and custom CMOS integrated ones. The results show a considerable vulnerability and exacerbate the scenario of EMI pollution It follows that the PCB ground plane, commonly shared with other analog, digital or mixed-signal circuits, can be a critical point of EMI pickup and injection.
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