Abstract
The high frequency oscillator circuit is relatively more susceptive to Electro-Magnetic Interference (EMI) in Embedded Systems (ES). The effect of EMI can be both deterministic and random in nature that shows up as jitter in the time domain and translates into the phase noise in the frequency domain. If the impact of EMI is too large, the performance of the entire system would be affected in terms of accuracy, stability, start-up, and phase noise. In this paper, the likelihood of observing such a failure in a noisy electromagnetic environment is discussed for giving brief insights about the EMI dynamics and EMI-induced failure mode of the crystal oscillator circuits. The goals of this paper is to provide the design philosophy by which time jitter and phase noise due to radiated EMI can be reduced to below operational levels.
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