Abstract
Testing of IC (integrated circuit) components is a key activity in IC component manufacturing to ensure components shipped out meet product data sheet and quality specifications. In order to achieve high productivity levels, the ATE (automated test equipment) is coupled to an automated handler. However, the use of the handler also introduces issues, such as ESD (electro-static discharge). As most traditional ESD controls are typically HBM (human body model) ESD, they do not effectively address handler ESD issues, which are predominantly charged device model (CDM). This paper details the difference in both ESD models; the assessment techniques, including advanced techniques such as EMI (electromagnetic interference) ESD detection and provide yield enhancing solutions for ESD prevention in handlers.
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