Abstract

Process optimization of photovoltaic devices is a time-intensive, trial-and-error endeavor, which lacks full transparency of the underlying physics and relies on user-imposed constraints that may or may not lead to a global optimum. Herein, we demonstrate that embedding physics domain knowledge into a Bayesian network enables an optimization approach for gallium arsenide (GaAs) solar cells that identifies the root cause(s) of underperformance with layer-by-layer resolution and reveals alternative optimal process windows beyond traditional black-box optimization. Our Bayesian network approach links a key GaAs process variable (growth temperature) to material descriptors (bulk and interface properties, e.g., bulk lifetime, doping, and surface recombination) and device performance parameters (e.g., cell efficiency). For this purpose, we combine a Bayesian inference framework with a neural network surrogate device-physics model that is 100× faster than numerical solvers. With the trained surrogate model and only a small number of experimental samples, our approach reduces significantly the time-consuming intervention and characterization required by the experimentalist. As a demonstration of our method, in only five metal organic chemical vapor depositions, we identify a superior growth temperature profile for the window, bulk, and back surface field layer of a GaAs solar cell, without any secondary measurements, and demonstrate a 6.5% relative AM1.5G efficiency improvement above traditional grid search methods.

Highlights

  • Process optimization is essential to reach maximum performance of novel materials and devices

  • We developed and applied a Bayesian network approach to gallium arsenide (GaAs) solar cell growth optimization

  • This approach enables us to exceed our baseline efficiency by 6.5% relative, by tuning process variables layer by layer, in just six metal organic chemical vapor deposition (MOCVD) experiments

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Summary

INTRODUCTION

Process optimization is essential to reach maximum performance of novel materials and devices. We chose to map doping concentration in between process variables and materials descriptors, embedding emitter and bulk, bulk lifetime (τ), front and rear (indium gallium physics domain knowledge, and ensuring faster and better phosphide) InGaP/GaAs surface recombination velocities (SRVs) to convergence of our Bayesian optimization algorithm This growth temperature using, and customize the growth temperature that maximize those desired material properties. The physical insights from the Bayesian network inference suggest an optimal growth temperature profile, allowing a significant 6.5% relative increase in average AM1.5G efficiency above baseline in a single temperature sweep (sixth MOCVD run) This result verifies the capacity of our approach to find optimal process windows with little intervention from the experimentalexpensive, it is essential to explore the process variable space efficiently.. Ist, no secondary characterization techniques or auxiliary samples, and with performance beyond experimentalistconstrained optimization

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