Abstract
Crystal and electronic structures of ~380 nm BiFeO3 film grown on LaAlO3 substrate are comprehensively studied using advanced transmission electron microscopy (TEM) technique combined with first-principles theory. Cross-sectional TEM images reveal the BiFeO3 film consists of two zones with different crystal structures. While zone II turns out to have rhombohedral BiFeO3, the crystal structure of zone I matches none of BiFeO3 phases reported experimentally or predicted theoretically. Detailed electron diffraction analysis combined with first-principles calculation allows us to determine that zone I displays an orthorhombic-like monoclinic structure with space group of Cm (=8). The growth mechanism and electronic structure in zone I are further discussed in comparison with those of zone II. This study is the first to provide an experimentally validated complete crystallographic detail of a highly strained BiFeO3 that includes the lattice parameter as well as the basis atom locations in the unit cell.
Highlights
Crystal and electronic structures of a ~380 nm BFO film grown on a LAO substrate were studied using advanced TEM techniques and the first-principles calculations
BF TEM images reveal that the BFO film consists of two zones, i.e., zone I (=m-BFO) and zone II (=r-BFO), with different crystal structures
Multiple zone axes ED analysis combined with structure factor calculation readily reveal that crystal structure in zone II is rhombohedral
Summary
Crystal and electronic structures of a ~380 nm BFO film grown on a LAO substrate were studied using advanced TEM techniques and the first-principles calculations. BF TEM images reveal that the BFO film consists of two zones, i.e., zone I (=m-BFO) and zone II (=r-BFO), with different crystal structures.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
