Abstract
ELNES Si L-, K-edge and 0 K-edge spectroscopy as a tool for distinction of four- vs. six-coordinated silicon in high-pressure phases
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
Paper Title
Journal
Date
