Abstract
We propose a three-wavelength elliptically polarized light photoelasticity method for high efficiency and low-cost stress measurement. By illuminating the sample with two different forms of elliptically polarized light for each wavelength sources, twelve images are acquired. From these images, phase delay and the principal internal stress difference are precisely computed using developed algorithms. Our proposed method based on an LCD panel has the unrivalled advantage that elliptically polarized light can be automatically adjusted, which reduces the mechanical rotation of the system, in contrast to the traditional six-step phase-shifting photoelasticity method, which requires manual rotation for circularly polarized light. In addition, the system has the potential to theoretically expand the area of illumination infinitely, thereby expanding the measurement area. The viability of the suggested methods is confirmed with numerical simulation and stress measurement.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
