Abstract
We propose an overdrive method for rotating major and minor axes of an elliptical refractive-index-distribution at a hole-patterned aperture of a liquid crystal (LC) device with multiple-divided circularly hole-patterned electrodes and an external flat electrode. The transient properties of the elliptical fringe pattern through the hole-patterned aperture of the LC device with positive and negative lens powers are measured by using a polarizing microscope with a high frame rate charge coupled device (CCD) camera. The response time for rotating the major and minor axes of the elliptical refractive index distribution obtained by the fringe patterns at an in-plane direction can be improved by shortly applying the overdrive voltage to each electrode.
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