Abstract
A new method is proposed for studying surfaces in the region of resonance interaction of electromagnetic radiation with surface elementary excitations. In this method the sample surface is illuminated through the ATR prism having a thin metallic layer on its base, and the ellipsometric angles of the reflected beam are measured. We have studied ellipsometry in measuring refraction and absorption indices at the surface. A substantial improvement of sensitivity was demonstrated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
