Abstract
Optical and structural properties of materials can be characterized by spectroscopic ellipsometry which represents an experimental technique that measures polarized light reflected from a material surface. Since the most complicated part of this method is data analysis and modeling, we present the calculation of the ellipsometric parameters for bi-isotropic materials. We consider the ellipsometric model for these materials which require not just permittivity like in conventional model, but also magnetic permeability and magneto electric coupling.
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