Abstract
Preamble.- Preface.- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis.- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations.- Relationship between Surface Morphology and Effective Medium Roughness.- Plasmonics and Effective-Medium Theory.- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings.- Mueller matrix applied to nanostructures.- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles.- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition.- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures.- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates.- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale.- Polarimetric and other Optical Probes for the Solid - Liquid Interface.- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices.- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications.- Ellipsometry of semiconductor nanocrystals.- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry.- Thin film applications in research and industry characterized by spectroscopic ellipsometry.- Ellipsometry and Correlation Measurements.- Nanotechnology: Applications and markets, present and future.
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