Abstract
The thickness of the tunneling barrier of AlAl x O y Al and AlAl x O y Pb junctions was determined using an automated ellipsometer. It is shown that the tunneling resistance depends exponentially on the barrier thickness. A practical consequence is that any wanted tunneling resistance can be realized within the accuracy of half an order of magnitude.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have