Abstract
The director tilt angle distribution in vertically aligned nematic liquid crystal displays has been investigated by means of variable angle spectroscopic ellipsometry. Liquid crystal vertical alignment has been realized by thermal evaporation of SiOx. By changing the deposition angle, it is possible to control the pretilt angle. The director profile inside the sample was inferred by reflection and transmission ellipsometric measurements. The tilt angle distribution inside the cell versus the applied voltage is reported and eventually, comparing it with the simulations from the elastic theory, the anchoring energy has been obtained.
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