Abstract
The ellipsometric spectra of vacuum sublimed cobalt phthalocyanine (CoPc) thin films on single-crystal silicon were studied on a new type of scanning photometric ellipsometer in which the analyser and polarizer rotate synchronously. The complex dielectric function and optical constants of the film have been obtained in the wavelength range 550–800 nm. It has been found that there is a comparatively large absorption region at 600–750 nm for the vacuum sublimed CoPc film and the exciton coupling greatly influences its absorption spectrum.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
