Abstract
In this study three conventional bipolar linear microcircuits, the LM101A operational amplifier, the LM124 quad operational amplifier, and the LM139 quad voltage comparator, were irradiated at high dose rate, elevated temperature and the results compared to low dose rate, room temperature response. While the high dose rate degradation at elevated temperature was greater than the degradation at room temperature, it was not as great as the degradation at low dose rate. Therefore, a hardness assurance test using elevated temperature irradiation at higher dose rates, designed to bound the very low dose rate response, will probably have to include overtest.
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