Abstract
We investigated the effects of scattering-interference of primary electrons on the secondary electron emission intensity fron ordered surfaces and interfaces. Because of the focusing-defocusing of the primary wave along atomic chains, maxima in the electron yield occur when the exciting beam is aligned with low index axes. Therefore the electron intensity distributions as a function of the angle of incidence of the primary beam can be interpreted as projected images of real space, local atomic arrangement. The process can be modelled in a single scattering cluster (SSC) approximation. Potential of primary-beam diffraction modulated electron emission (PDMEE) technique for surface and subsurface structural characterization is shown, for Co epitaxy on Fe(001).
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