Abstract
The concentrations of 13 elements (As, Ca, Co, Cd, Cr, Fe, Ga, Ni, Pb, Pt, Ti, V and Zn) were determined in air particulate matter using total reflection X-ray fluorescence spectrometry (TXRF). For silicon analysis synthetic sapphire was chosen as a new sample carrier material – it is silicon-free, resistant to oxygen-plasma, microwaves and concentrated acids. The dust samples were collected on cellulose acetate filters. The decomposition of the filters was carried out by oxidation in a microwave-generated low-pressure oxygen-plasma directly on the TXRF sample carriers. The recovery of the investigated elements was verified with the standard reference material SRM 1648 (urban particulate matter) and ranged from 90 to 97%. The oxygen-plasma method was compared with conventional sample preparation by acid digestion.
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