Abstract
Element-sensitive computed tomography (CT) experiments were carried out based on the absorption edge of a specific element using a finely tunable X-ray beam generated by parametric X-ray radiation (PXR). Tomographic images of specimens containing strontium were measured at energies both lower and higher than that of the Sr absorption edge. The difference between the images of the two energies successfully reveals the three-dimensional distributions of Sr. The results demonstrate that this method is effective for elemental analysis of considerably thick samples and could complement X-ray fluorescence analysis.
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