Abstract

AbstractIn Cu(In,Ga)Se2 (CIGS) thin‐film solar cells, laterally inhomogeneous distributions of point defects may induce electrostatic potential fluctuations and thus reduce the open‐circuit voltage (Voc). In the present work, we investigate possible origins of fluctuating potentials and estimate the amplitude of fluctuations and Voc losses in solar cells with various [Ga] in the CIGS absorber, with different buffer layers and with different durations of an RbF postdeposition treatment (PDT). Electron‐beam‐induced current measurements were employed to study the local difference in the width of the space‐charge region (wSCR). It is shown that the amplitude of fluctuations in the wSCR depends significantly on the choice of buffer system and on the duration of the RbF PDT. In addition, energy‐dispersive X‐ray spectroscopy and cathodoluminescence measurements reveal that band‐gap fluctuations do not have substantial impact on the device performance. Finally, some of the investigated cells were exposed to light soaking, which was found to be a means to reduce the detected electrostatic potential fluctuations and also to increase the effective electron diffusion length in the CIGS absorber for a part of the investigated cells.

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