Abstract
Electrospray droplet imact/secondary ion mass spectrometry (EDI/SIMS) was applied to many materials such as synthetic polymers, metals, semiconductors, and biological tissues. Little surface modification was observed for these samples by in situ XPS analysis. In this work, silver halides AgX (X = F, Cl, Br, and I) were examined by EDI/SIMS. The preferential etching of F for AgF was observed for the first time. This is due to the highly reactive F atoms generated at the colliding interface that are quickly annihilated by the reaction with water molecules. The selective etching of fluorine results in the enrichment of silver on the sample surface leading to the abundant Ag+ ion formation. It was suggested that metal fluorides may be useful as the cationization matrices in EDI/SIMS. Copyright © 2014 John Wiley & Sons, Ltd.
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