Abstract
Electroresistance phenomena have been investigated in La2/3Sr1/3MnO3 (LSMO) microbridges through the analysis of I-V characteristic curves. I-V curves are nonlinear in all the range of temperatures explored, but are almost reversible and exhibit origin symmetry which suggest the existence of Joule self-heating effects. However, comparing the resistance determined from the I-V curves (R = V/I) at the actual sample temperature, measured through a Pt thermometer microfabricated on top of the LSMO microbridges, with the resistance measured in thermal equilibrium, i.e., in the low current regime, it is evident that Joule self-heating effects alone cannot account for the experimental results. We demonstrate that oxygen depletion is the cause for the observed increase of resistance and the reduction of TC.
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