Abstract
We have investigated the electrophysical properties of metallic thin films based on Cu/Cr and Fe/Cr systems. We find that the longitudinal gauge factor of two-layer films is significantly greater as compared with one-layer films, which have the same thickness as the total thickness of a two-layer film. Interface and intensive grain–boundary electron scattering explain such an increase in the longitudinal gauge factor. We find that the longitudinal gauge factor increases in transition from elastic to plastic zone.
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