Abstract
We report on a compact, reliable and easy to use electrooptic sampling system based on a self-seeded semiconductor laser having a temporal resolution of <1 ps and a shot noise limited sensitivity of 1 mV. With an operating wavelength of 1.55 /spl mu/m and 0.5-ps time jitter of the optical source, it is particularly suited for ultrahigh-speed devices and integrated circuits. For demonstration, results for an ultrafast metal-semiconductor-metal photodetector are presented.
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