Abstract
In order to study the electronic properties of conjugated polymer nanowire junctions, we have fabricated two devices consisting of two crossed poly(3,4-ethylenedioxythiophene) (PEDOT) nanowires with platinum microleads attached to each end of each nanowire. We find that the junction resistance of the crossed nanowires is much larger than the intrinsic resistance of the individual PEDOT nanowire, and increases with decreasing temperature, which can be described by a thermal fluctuation-induced tunneling conduction model. In addition, the crossed junctions show linear current-voltage characteristics at room temperature.
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