Electronic System Design Techniques

Abstract

The design of a radiation-hardened electronic system is in many ways no different from the design of electronic systems which must perform correctly while exposed to the more standard environments, such as temperature, vibration, and humidity. The early recognition of shock, vibration, temperature, humidity, and acceleration as environments which would influence electrical performance of the electronic systems has resulted in a thorough understanding of how to design against these environments. The reader familiar with electronic design in the more standard environments should endeavor to apply good design techniques from these environments to that of nuclear radiation, when the techniques seem applicable. This is seldom possible, since the radiation environment is in most ways quite unique, though there are instances where the approach can be used. For example, the design of electronics for operation in high temperatures (100 to 600°C) will also result in an electronic system which can withstand large integrated particle doses without degradation. The application of failure probability analysis, which is quite common for the more standard environments, has been generally neglected in work associated with the nuclear radiation environment. The importance of the failure probability analysis cannot be stressed enough. The single or few test sample determinations of component radiation sensitivity may be adequate early in the design cycle of a particular electronic system. However, toward the end of the design cycle, large test sample determination is a must in order to establish high confidence in the component selection for production units of the electronic system.