Abstract
Ultraviolet photoelectron spectroscopy (UPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy were used to study the electronic structure of photo-degraded ultra thin films of polypropylene. The films were exposed to a zero-order of synchrotron radiation light that led to degradation in the polypropylene chemical structure. UPS experimental results revealed the formation of carbon double bonds in the photo-degraded thin films. This formation was further confirmed with molecular orbital calculation and NEXAFS spectroscopy.
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