“Electronic structure” beamline 1-6 at SKIF synchrotron facility

Abstract

SKIF is a synchrotron facility to be commissioned in 2024. One of the six beamlines planned to be built in the first phase is the "Electronic Structure" beamline. Now three branch lines are funded, which will host the endstations for Near Ambient Pressure X-Ray Photoelectron Spectroscopy (NAP XPS), Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES), and Reflectometry and Metrology. The current work presents the conceptual design of the "Electronic Structure" beamline. The NAP XPS endstation will enable in situ and operando studies of a wide range of catalytic systems and in situ studies of regularities of deactivation/poisoning processes for catalytic systems depending on different conditions and of innovative functional materials. Another important technique that will be realized on the beamline (another branch line) involves the Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) endstation, which will enable study of the electronic and spin structure of solids for applications in nanoelectronics and spintronics. The third endstation, Reflectometry and Metrology (the third branch line), will be used for certification of spectral optical elements, focusing elements, and X-ray detectors. For absolute calibration of the spectral sensitivity of detectors, reference detector techniques will be implemented. Both a secondary reference detector (silicon photodiode) and a primary one (HTSC superconducting bolometer) will be used as a reference one.