Abstract

X-ray absorption near edge structure (XANES), together with X-ray excited optical luminescence (XEOL) techniques, has been used to investigate the electronic structure and the optical properties of several prototype ruthenium(II) Organic Light Emitting Device (OLED) materials. We probe the Ru L3-edge, the P K-edge and the Cl K-edge of a series of Ru(II) based complexes with N and P containing ligands as well as PF6− and ClO4− counter ions. We present high resolution XANES and XEOL results of these complexes and show that the optical luminescence is sensitive to the excitation channel. The element and excitation channel specificity of these techniques and their applications are noted.

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