Abstract
We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 kΩ and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ∼165 K.
Highlights
This article was downloaded from Harvard University's DASH repository
Initial experiments performed on metallic nanotubes concentrated on tubes
Theoretical studies of the effects of mechanical deformation on electrical properties of carbon nanotubes have shown that localized distortions of the lattice should cause an increase in electron backscattering
Summary
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