Abstract
This paper presents, for the first time, a multi-harmonic active envelope load-pull system allowing for the robust, high-speed characterization of devices used in modern microwave power amplifiers. Measurements of a commercially available 1W GaAs FET device demonstrate at least an eight-fold improvement in the measurement speed when compared to existing open-loop solutions. The developed active load-pull system, which instantly reacts, via baseband feedback, has the ability to set load impedances that are independent of changing device conditions. Thus it is similar to passive systems, but without the associated loss. This system is shown to be valuable in allowing the utilization of rapid, experimental, measurement driven optimization within the power amplifier design and yield analysis process.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
