Abstract
The aim of this paper is to present the state of the art in photothermal characterization of electronic materials and devices. Two aspect are discussed: first, the characterization of thermal and electronic transport in these materials and second, the thermal imaging of biased devices. In this second part, we will insist on the advantages of photothermal imaging compared to other thermal methods, mainly infrared imaging.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
