Abstract
An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.
Highlights
An electronic detector of surface plasmon polaritons (SPPs) is reported
We present the detection of SPPs on the metal layer of a Kretschmann prism-coupler[4] by bringing a metal-oxide-silicon (MOS)-capacitor into proximity of the SPP fields
Electromagnetic radiation is internally incident on a thin metal film on the long face of a Kretschmann prism coupler,[4] where SPPs are excited at a particular frequency determined by the internal incidence angle
Summary
Smith,[1] Farnood Khalilzadeh-Rezaie,[1] Masa Ishigami,[1] Nima Nader,[2,3] Shiva Vangala,[2,4] and Justin W. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor.
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