Abstract
The electronic-controlling nanotribological behavior of textured silicon surfaces was investigated by an atomic force microscope (AFM), which were fabricated by laser interference lithography and chemical etching. The results indicated that without an external bias, friction on textured surfaces was greater than that on smooth surfaces and it was related to the coverage rate of the microgrooves. With an external bias, friction on smooth and textured surfaces decreased at first and then increased approximately linearly as the external bias increased.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
