Abstract
The formation of the Cu-Bi 2CaSr 2Cu 2O 8 interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20–1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the core-level shifts. A strong chemical reaction between Bi 2CaSr 2Cu 2O 8 and Cu is manifested by the formation of metallic Bi. From theb density variations as a function of electron emission angle it is shown that the metallic Bi segregates to the top surface layer.
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