Abstract
The electronic structure of BiFeO3 (BFO), BiFeO3–PbTiO3 solid solution (BFO–PT), and Mn-doped BFO–PT (BFM–PT) films fabricated by chemicalsolution deposition was investigated by x-ray absorption fine structure (XAFS). TheBiFeO3 shows a large leakage current owing to the mixed valance state ofFe2 + andFe3 + . The BFO film has a blunt absorption edge jump indicating the charge fluctuated state ofthe iron ions. The BFO–PT and BFM–PT films have sharp absorption edges, and theabsorption energy of these films shifted to opposite energy. The valence fluctuation of theiron ions was closely connected with the leakage current properties. The charge fluctuatedBFO film showed a leaky feature, and the charge unfluctuated BFO–PT and BFM–PTfilms had improved leakage current properties. The valence fluctuation of theiron ions can be controlled by Mn substitution and by making solid solutions.
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