Abstract

The Na 2 SO 4 samples were obtained by slow evaporation method. The mechanisms of the formation of electron and hole trapping centers are investigated by spectroscopic methods. Intrinsic recombination emission of 2.9–3.1 eV and impurity emission of 1.85 eV are excited at 4.0–4.5 eV. Intrinsic SO 3− 4 −SO − 4 and impurity Mn + − SO − 4 trapping centers were revealed. The local levels corresponding between the electron and hole trapping center are 4.0–4.5 eV. The decay of intrinsic and impurity trapping centers was recorded at temperatures of 130–150 K and 280–350 K.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call