Abstract
Composite systems containing zirconia have been used extensively as transformation-toughening materials based on a stress induced martensitic transformation of the metastable tetragonal phase of zirconia to the monoclinic phase. Recently it has been shown that tetragonal zirconia can be stabilized in zirconia-alumina nanolaminates grown by reactive sputter deposition, when the zirconia layer is less than 6 nm thick. Cross-section high resolution transmission electron microscopy (HRTEM) of these nanolaminates revealed localized tetragonal-to-monoclinic transformation caused by sample preparation. In this study, quantitative HRTEM is used to analyze the zirconia nanocrystallite transformation in situ, by controlled exposure of the sample to the electron beam of the microscope.The irradiation conditions used in this study to induce the zirconia transformation are summarized in Table 1. The mildest irradiation condition corresponds to normal imaging illumination used in this study to obtain high resolution images. Under these normal illumination conditions, the first condenser lens (CI) is used to form a 0.1 μm sized probe which is over focused on the sample by the second condenser lens (C2).
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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