Abstract
A compact electron-based microfocus EUV/soft-x-ray source for applications in metrology and microscopy is developed. The source concept is based on the transfer of advanced microfocus x-ray tube technology into the EUV/soft-x-ray spectral range. This allows the realization of a flexible, debris-free, and long-term stable source. Detailed characteristics of the source performance are reported and different applications of the soft-x-ray tube in the field of at-wavelength metrology are presented.
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