Abstract

The electronic transport and response in the terahertz range are studied in field-effect GaAs/AlGaAs transistors with a two-dimensional high-mobility electron gas. The special interest expressed in such transistors stems from the possibility of developing terahertz-range radiation detectors and generators on the basis of these devices. Measurements of the value and the magnetic-field dependence of the drain-source resistance are used to estimate the electron density and mobility in the transistor channel. Results of magnetotransport measurements are employed to interpret the nonresonant detection observed in transistors with a gate width from 0.8 to 2.5 µm.

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