Abstract
By monitoring the variation in the fluorine content and the distribution of CF x (x=0–3) species in a semifluorinated self-assembled monolayer (CF-SAM) upon prolonged X-ray irradiation, the electron stimulated C–F bond breaking kinetics in fluorine-containing organic films has been determined. At short irradiation times, X-ray irradiation induced changes in the film's chemical composition are consistent with the presence of C–F, C–C and S–Au bond cleavage events. In contrast, C–F bond breaking is identified as the dominant kinetic process for longer X-ray exposures. The kinetics of X-ray induced defluorination are consistent with a first-order decay process mediated by a series of consecutive C–F bond breaking events (e.g., CF→C) whose rate constants are in excellent agreement with a stochastic model of defluorination.
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