Abstract
Abstract New electron spin resonance (ESR) lines with g1 = 2·0017 and g2 and g3 = 2·0006 have been found in the ESR spectra of as-deposited a-Si1–x Cx:H films prepared by magnetron sputtering of silicon in the gas mixtures of methane and argon. Similarities between the observed spectra and those for the E′ centre in glassy SiO2 are discussed.
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