Abstract
It is experimentally demonstrated that, upon the application of a subnanosecond high-voltage pulse to the gap of a diode filled with air at atmospheric pressure, a bunch of runaway electrons is formed in a sharply inhomogeneous electric field near the cathode. The bunch duration does not exceed 50 ps, which is shorter than the electron flight time through the interelectrode gap in the continuous acceleration regime. This duration remained unchanged when the gap width was varied between 6 and 26 mm. The electron energy in the picosecond electron beam, as determined from the time-of-flight measurements in the drift channel behind the anode foil of the diode, agree with the results of numerical calculations of the electron acceleration dynamics in the vacuum diode approximation.
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